TY  - RPRT
TI  - Estimation of Defect proneness Using Design complexity Measurements in Object- Oriented Software
AU  - R. Selvarani
AU  - T. R. Gopalakrishnan Nair
AU  - V. Kamakshi Prasad
PY  - 2010
DO  - 10.1109/icsps.2009.163
UR  - https://arxiv.org/abs/1001.3555
ID  - 1001.3555
ER  -