@misc{indiciae54de051cabee,
  title = {Thickness monitoring of graphene on SiC using low-energy electron diffraction},
  author = {P. J. Fisher and Luxmi and N. Srivastava and S. Nie and R. M. Feenstra},
  year = {2010},
  url = {https://arxiv.org/abs/1002.0997},
  note = {Source identifier: 1002.0997}
}