TY  - RPRT
TI  - Thickness monitoring of graphene on SiC using low-energy electron diffraction
AU  - P. J. Fisher
AU  - Luxmi
AU  - N. Srivastava
AU  - S. Nie
AU  - R. M. Feenstra
PY  - 2010
UR  - https://arxiv.org/abs/1002.0997
ID  - 1002.0997
ER  -