@misc{indiciaeac118aa4bfc4,
  title = {Quantitative analysis of atomic disorders in full-Heusler Co2FeSi alloy thin films using x-ray diffraction with Co-Ka and Cu-Ka sources},
  author = {Yota Takamura and Ryosho Nakane and Satoshi Sugahara},
  year = {2010},
  doi = {10.1063/1.3350914},
  url = {https://arxiv.org/abs/1002.1564},
  note = {Source identifier: 1002.1564}
}