TY  - RPRT
TI  - Quantitative analysis of atomic disorders in full-Heusler Co2FeSi alloy thin films using x-ray diffraction with Co-Ka and Cu-Ka sources
AU  - Yota Takamura
AU  - Ryosho Nakane
AU  - Satoshi Sugahara
PY  - 2010
DO  - 10.1063/1.3350914
UR  - https://arxiv.org/abs/1002.1564
ID  - 1002.1564
ER  -