@misc{indiciaeaec49ff24616,
  title = {Measuring Nanoscale Stress Intensity Factors with an Atomic Force Microscope},
  author = {Kun Han and Matteo Ciccotti and Stéphane Roux},
  year = {2010},
  doi = {10.1209/0295-5075/89/66003},
  url = {https://arxiv.org/abs/1002.1877},
  note = {Source identifier: 1002.1877}
}