TY  - RPRT
TI  - Measuring Nanoscale Stress Intensity Factors with an Atomic Force Microscope
AU  - Kun Han
AU  - Matteo Ciccotti
AU  - Stéphane Roux
PY  - 2010
DO  - 10.1209/0295-5075/89/66003
UR  - https://arxiv.org/abs/1002.1877
ID  - 1002.1877
ER  -