TY  - RPRT
TI  - Electronic Structure of Few-Layer Graphene: Experimental Demonstration of Strong Dependence on Stacking Sequence
AU  - Kin Fai Mak
AU  - Jie Shan
AU  - Tony F. Heinz
PY  - 2010
DO  - 10.1103/physrevlett.104.176404
UR  - https://arxiv.org/abs/1002.2225
ID  - 1002.2225
ER  -