@misc{indiciae3e24a9b14f47,
  title = {Logarithmic behavior of degradation dynamics in metal--oxide semiconductor devices},
  author = {Roberto da Silva and Gilson I. Wirth},
  year = {2010},
  doi = {10.1088/1742-5468/2010/04/p04025},
  url = {https://arxiv.org/abs/1002.3571},
  note = {Source identifier: 1002.3571}
}