TY  - RPRT
TI  - Logarithmic behavior of degradation dynamics in metal--oxide semiconductor devices
AU  - Roberto da Silva
AU  - Gilson I. Wirth
PY  - 2010
DO  - 10.1088/1742-5468/2010/04/p04025
UR  - https://arxiv.org/abs/1002.3571
ID  - 1002.3571
ER  -