@misc{indiciaee0658fa7f962,
  title = {Analysis of Trace Impurities in Semiconductor Gas via Cavity-Enhanced Direct Frequency Comb Spectroscopy},
  author = {Kevin C. Cossel and Florian Adler and Kris A. Bertness and Michael J. Thorpe and Jun Feng and Mark W. Raynor and Jun Ye},
  year = {2010},
  doi = {10.1007/s00340-010-4132-5},
  url = {https://arxiv.org/abs/1003.1314},
  note = {Source identifier: 1003.1314}
}