TY  - RPRT
TI  - Analysis of Trace Impurities in Semiconductor Gas via Cavity-Enhanced Direct Frequency Comb Spectroscopy
AU  - Kevin C. Cossel
AU  - Florian Adler
AU  - Kris A. Bertness
AU  - Michael J. Thorpe
AU  - Jun Feng
AU  - Mark W. Raynor
AU  - Jun Ye
PY  - 2010
DO  - 10.1007/s00340-010-4132-5
UR  - https://arxiv.org/abs/1003.1314
ID  - 1003.1314
ER  -