@misc{indiciae85bc186d6358,
  title = {Penetration depth of electron-doped-infinite-layer Sr\$\_\{0.88\}\$La\$\_\{0.12\}\$CuO\$\_\{2+x\}\$ thin films},
  author = {L. Fruchter and V. Jovanovic and H. Raffy and Sid Labdi and F. Bouquet and Z. Z. Li},
  year = {2010},
  doi = {10.1103/physrevb.82.144529},
  url = {https://arxiv.org/abs/1003.5559},
  note = {Source identifier: 1003.5559}
}