TY  - RPRT
TI  - Tightness for the interface of the one-dimensional contact process
AU  - Enrique Andjel
AU  - Thomas Mountford
AU  - Leandro P. R. Pimentel
AU  - Daniel Valesin
PY  - 2010
DO  - 10.3150/09-bej236
UR  - https://arxiv.org/abs/1004.1951
ID  - 1004.1951
ER  -