TY  - RPRT
TI  - Systematic Investigation of the Intrinsic Channel Properties and Contact Resistance of Monolayer and Multilayer Graphene FET
AU  - Kosuke Nagashio
AU  - Tomonori Nishimura
AU  - Koji Kita
AU  - Akira Toriumi
PY  - 2010
DO  - 10.1143/jjap.49.051304
UR  - https://arxiv.org/abs/1004.2074
ID  - 1004.2074
ER  -