@misc{indiciaeb6943c0585ca,
  title = {Trapped-ion probing of light-induced charging effects on dielectrics},
  author = {Maximilian Harlander and Michael Brownnutt and Wolfgang Hänsel and Rainer Blatt},
  year = {2010},
  doi = {10.1088/1367-2630/12/9/093035},
  url = {https://arxiv.org/abs/1004.4842},
  note = {Source identifier: 1004.4842}
}