TY  - RPRT
TI  - Trapped-ion probing of light-induced charging effects on dielectrics
AU  - Maximilian Harlander
AU  - Michael Brownnutt
AU  - Wolfgang Hänsel
AU  - Rainer Blatt
PY  - 2010
DO  - 10.1088/1367-2630/12/9/093035
UR  - https://arxiv.org/abs/1004.4842
ID  - 1004.4842
ER  -