TY  - RPRT
TI  - Strong Electron Confinement By Stacking-fault Induced Fractional Steps on Ag(111) Surfaces
AU  - Takashi Uchihashi
AU  - Katsuyoshi Kobayashi
AU  - Tomonobu Nakayama
PY  - 2010
DO  - 10.1103/physrevb.82.113413
UR  - https://arxiv.org/abs/1005.1113
ID  - 1005.1113
ER  -