TY  - RPRT
TI  - Hall carrier density and magnetoresistance measurements in thin film vanadium dioxide across the metal-insulator transition
AU  - Dmitry Ruzmetov
AU  - Don Heiman
AU  - Bruce B. Claflin
AU  - Venkatesh Narayanamurti
AU  - Shriram Ramanathan
PY  - 2010
DO  - 10.1103/physrevb.79.153107
UR  - https://arxiv.org/abs/1006.4376
ID  - 1006.4376
ER  -