@misc{indiciaebdc06eb8088d,
  title = {O-vacancy as the origin of negative bias illumination stress instability in amorphous In-Ga-Zn-O thin film transistors},
  author = {Byungki Ryu and Hyeon-Kyun Noh and Eun-Ae Choi and K. J. Chang},
  year = {2010},
  doi = {10.1063/1.3464964},
  url = {https://arxiv.org/abs/1006.4913},
  note = {Source identifier: 1006.4913}
}