TY  - RPRT
TI  - O-vacancy as the origin of negative bias illumination stress instability in amorphous In-Ga-Zn-O thin film transistors
AU  - Byungki Ryu
AU  - Hyeon-Kyun Noh
AU  - Eun-Ae Choi
AU  - K. J. Chang
PY  - 2010
DO  - 10.1063/1.3464964
UR  - https://arxiv.org/abs/1006.4913
ID  - 1006.4913
ER  -