TY  - RPRT
TI  - Measurements of charge carrier mobilities and drift velocity saturation in bulk silicon of <111> and <100> crystal orientation at high electric fields
AU  - Julian Becker
AU  - Eckhart Fretwurst
AU  - Robert Klanner
PY  - 2010
DO  - 10.1016/j.sse.2010.10.00
UR  - https://arxiv.org/abs/1007.4432
ID  - 1007.4432
ER  -