@misc{indiciae263e14a58232,
  title = {Extending Electrical Resistivity Measurements in Micro-scratching of Silicon to Determine Thermal Conductivity of the Metallic Phase Si-II},
  author = {Hisham A. Abdel-Aal and Ysai Reyes and John A. Patten and Lei Dong},
  year = {2010},
  url = {https://arxiv.org/abs/1008.1363},
  note = {Source identifier: 1008.1363}
}