TY  - RPRT
TI  - Extending Electrical Resistivity Measurements in Micro-scratching of Silicon to Determine Thermal Conductivity of the Metallic Phase Si-II
AU  - Hisham A. Abdel-Aal
AU  - Ysai Reyes
AU  - John A. Patten
AU  - Lei Dong
PY  - 2010
UR  - https://arxiv.org/abs/1008.1363
ID  - 1008.1363
ER  -