@misc{indiciaecad6d7f8fc26,
  title = {Elastic Mid-Infrared Light Scattering: a Basis for Microscopy of Large-Scale Electrically Active Defects in Semiconducting Materials},
  author = {V. P. Kalinushkin and V. A. Yuryev and O. V. Astafiev},
  year = {2010},
  doi = {10.1063/1.1150076},
  url = {https://arxiv.org/abs/1008.1772},
  note = {Source identifier: 1008.1772}
}