TY  - RPRT
TI  - Elastic Mid-Infrared Light Scattering: a Basis for Microscopy of Large-Scale Electrically Active Defects in Semiconducting Materials
AU  - V. P. Kalinushkin
AU  - V. A. Yuryev
AU  - O. V. Astafiev
PY  - 2010
DO  - 10.1063/1.1150076
UR  - https://arxiv.org/abs/1008.1772
ID  - 1008.1772
ER  -