@misc{indiciae9af34ece8ca6,
  title = {Strain-voltage and current-voltage Scanning Probe Microscopy (SPM) response of ionic semiconductor thin films: probing of deformation potential},
  author = {A. N. Morozovska and E. A. Eliseev and S. L. Bravina and S. V. Kalinin},
  year = {2010},
  url = {https://arxiv.org/abs/1008.2389},
  note = {Source identifier: 1008.2389}
}