TY  - RPRT
TI  - Strain-voltage and current-voltage Scanning Probe Microscopy (SPM) response of ionic semiconductor thin films: probing of deformation potential
AU  - A. N. Morozovska
AU  - E. A. Eliseev
AU  - S. L. Bravina
AU  - S. V. Kalinin
PY  - 2010
UR  - https://arxiv.org/abs/1008.2389
ID  - 1008.2389
ER  -