TY  - RPRT
TI  - Controlling Short-channel Effects in Deep Submicron SOI MOSFETs for Improved Reliability: A Review
AU  - Anurag Chaudhry
AU  - M. Jagadesh Kumar
PY  - 2010
UR  - https://arxiv.org/abs/1008.2427
ID  - 1008.2427
ER  -