@misc{indiciaec7cd4bffe6c7,
  title = {Compact Modeling of Parasitic Internal Fringe Capacitance Effects on the Threshold Voltage of High-K Gate Dielectric Nanoscale SOI MOSFETs},
  author = {M. Jagadesh Kumar and Sumeet Kumar Gupta and Vivek Venkataraman},
  year = {2010},
  doi = {10.1109/ted.2006.870424},
  url = {https://arxiv.org/abs/1008.3007},
  note = {Source identifier: 1008.3007}
}