TY  - RPRT
TI  - Compact Modeling of Parasitic Internal Fringe Capacitance Effects on the Threshold Voltage of High-K Gate Dielectric Nanoscale SOI MOSFETs
AU  - M. Jagadesh Kumar
AU  - Sumeet Kumar Gupta
AU  - Vivek Venkataraman
PY  - 2010
DO  - 10.1109/ted.2006.870424
UR  - https://arxiv.org/abs/1008.3007
ID  - 1008.3007
ER  -