TY  - RPRT
TI  - Diminished Short Channel Effects in Nanoscale Double-Gate Silicon-On-Insulator Metal-Oxide- Semiconductor Field-Effect-Transistors due to Induced Back-Gate Step Potential
AU  - M. Jagadesh Kumar
AU  - G. V. Reddy
PY  - 2010
UR  - https://arxiv.org/abs/1008.3016
ID  - 1008.3016
ER  -