TY  - RPRT
TI  - Impact of Strain on Drain Current and Threshold Voltage of Nanoscale Double Gate Tunnel Field Effect Transistor: Theoretical Investigation and Analysis
AU  - Sneh Saurabh
AU  - M. Jagadesh Kumar
PY  - 2010
DO  - 10.1143/jjap.48.064503
UR  - https://arxiv.org/abs/1008.3599
ID  - 1008.3599
ER  -