TY  - RPRT
TI  - Application of scanning mid-IR-laser microscopy for characterization of semiconductor materials for photovoltaics
AU  - V. P. Kalinushkin
AU  - O. V. Astafiev
AU  - V. A. Yuryev
PY  - 2010
DO  - 10.1016/s0927-0248(00)00076-3
UR  - https://arxiv.org/abs/1008.4050
ID  - 1008.4050
ER  -