TY  - RPRT
TI  - Scanning mid-IR-laser microscopy: an efficient tool for materials studies in silicon-based photonics and photovoltaics
AU  - O. V. Astafiev
AU  - V. P. Kalinushkin
AU  - V. A. Yuryev
PY  - 2010
DO  - 10.1016/s0022-0248(99)00711-3
UR  - https://arxiv.org/abs/1008.4057
ID  - 1008.4057
ER  -