TY  - RPRT
TI  - On the nature of large-scale defect accumulations in Czochralski-grown silicon
AU  - V. P. Kalinushkin
AU  - A. N. Buzynin
AU  - V. A. Yuryev
AU  - O. V. Astafiev
AU  - D. I. Murin
PY  - 2010
UR  - https://arxiv.org/abs/1008.4694
ID  - 1008.4694
ER  -