TY  - RPRT
TI  - Shot noise measurements in a wide-channel transistor near pinch-off
AU  - V. S. Khrapai
AU  - D. V. Shovkun
PY  - 2010
DO  - 10.1134/s0021364010190069
UR  - https://arxiv.org/abs/1008.4891
ID  - 1008.4891
ER  -