@misc{indiciae8d81507e1dbb,
  title = {Impact of Electrostatic Forces in Contact Mode Scanning Force Microscopy},
  author = {F. Johann and Á. Hoffmann and E. Soergel},
  year = {2010},
  doi = {10.1103/physrevb.81.094109},
  url = {https://arxiv.org/abs/1009.1905},
  note = {Source identifier: 1009.1905}
}