TY  - RPRT
TI  - Impact of Electrostatic Forces in Contact Mode Scanning Force Microscopy
AU  - F. Johann
AU  - Á. Hoffmann
AU  - E. Soergel
PY  - 2010
DO  - 10.1103/physrevb.81.094109
UR  - https://arxiv.org/abs/1009.1905
ID  - 1009.1905
ER  -