@misc{indiciaeb087490a06f1,
  title = {Heuristic approach to optimize the number of test cases for simple circuits},
  author = {SM. Thamarai and K. Kuppusamy and T. Meyyappan},
  year = {2010},
  doi = {10.5121/vlsic.2010.1302},
  url = {https://arxiv.org/abs/1009.6186},
  note = {Source identifier: 1009.6186}
}