TY  - RPRT
TI  - Heuristic approach to optimize the number of test cases for simple circuits
AU  - SM. Thamarai
AU  - K. Kuppusamy
AU  - T. Meyyappan
PY  - 2010
DO  - 10.5121/vlsic.2010.1302
UR  - https://arxiv.org/abs/1009.6186
ID  - 1009.6186
ER  -