TY  - RPRT
TI  - Internal Stresses and Formation of Switchable Nanowires at Thin Silica Film Edge
AU  - J. C. Phillips
PY  - 2010
DO  - 10.1063/1.3532035
UR  - https://arxiv.org/abs/1010.0193
ID  - 1010.0193
ER  -