TY  - RPRT
TI  - Statistical Modelling of ft to Process Parameters in 30 nm Gate Length Finfets
AU  - B. Lakshmi
AU  - R. Srinivasan
PY  - 2010
DO  - 10.5121/vlsi.2010.1304
UR  - https://arxiv.org/abs/1010.0471
ID  - 1010.0471
ER  -