@misc{indiciaeede92ed847eb,
  title = {Dielectric Thickness Dependence of Carrier Mobility in Graphene with HfO2 Top Dielectric},
  author = {Babak Fallahazad and Seyoung Kim and Luigi Colombo and Emanuel Tutuc},
  year = {2010},
  doi = {10.1063/1.3492843},
  url = {https://arxiv.org/abs/1010.0913},
  note = {Source identifier: 1010.0913}
}