TY  - RPRT
TI  - Dielectric Thickness Dependence of Carrier Mobility in Graphene with HfO2 Top Dielectric
AU  - Babak Fallahazad
AU  - Seyoung Kim
AU  - Luigi Colombo
AU  - Emanuel Tutuc
PY  - 2010
DO  - 10.1063/1.3492843
UR  - https://arxiv.org/abs/1010.0913
ID  - 1010.0913
ER  -