TY  - RPRT
TI  - Cryogenic Microwave Imaging of Metal-Insulator Transition in Doped Silicon
AU  - Worasom Kundhikanjana
AU  - Keji Lai
AU  - Michael A. Kelly
AU  - Zhi-Xun Shen
PY  - 2011
DO  - 10.1063/1.3554438
UR  - https://arxiv.org/abs/1010.1509
ID  - 1010.1509
ER  -