TY  - RPRT
TI  - Measurement of the \{220\} lattice-plane spacing of a $^{28}$Si crystal
AU  - Enrico Massa
AU  - Giovanni Mana
AU  - Ulrich Kuetgens
AU  - Luca Ferroglio
PY  - 2010
DO  - 10.1088/0026-1394/48/2/s06
UR  - https://arxiv.org/abs/1010.3088
ID  - 1010.3088
ER  -