@misc{indiciae1e03389cd8fa,
  title = {Estimation and Compensation of Process Induced Variations in Nanoscale Tunnel Field Effect Transistors (TFETs) for Improved Reliability},
  author = {Sneh Saurabh and M. Jagadesh Kumar},
  year = {2010},
  url = {https://arxiv.org/abs/1010.3476},
  note = {Source identifier: 1010.3476}
}