TY  - RPRT
TI  - Estimation and Compensation of Process Induced Variations in Nanoscale Tunnel Field Effect Transistors (TFETs) for Improved Reliability
AU  - Sneh Saurabh
AU  - M. Jagadesh Kumar
PY  - 2010
UR  - https://arxiv.org/abs/1010.3476
ID  - 1010.3476
ER  -