TY  - RPRT
TI  - System-size convergence of point defect properties: The case of the silicon vacancy
AU  - Fabiano Corsetti
AU  - Arash A. Mostofi
PY  - 2011
DO  - 10.1103/physrevb.84.035209
UR  - https://arxiv.org/abs/1010.3921
ID  - 1010.3921
ER  -